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Miwa Group, The Institute for Solid State Physics (ISSP), The University of Tokyo

Instruments

Room for staffs and students: A330

Study room



Experimental room I: A052

Experimental
Thin-film deposition system I

Thin-film deposition system I : MBE for metals

Custom-built MBE, Biemtron
6kW EB-gun Thermionics: crucible ~ 6
3kW EB-gun Thermionics: crucible ~ 4
Effusion cell: crucible ~ 2
Substrate heating > 900Ž
RHEED
Q-mass
Turbomolecular pump
Ion pump
Cryo-pump


Thin-film deposition system II

Thin-film deposition system II : MBE for organics

Custom-built MBE, Biemtron
3kW EB-gun Thermionics: crucible ~ 3
Effusion cell: crucible ~ 6
Substrate cooling < -100Ž
Turbomolecular pump
Ion pump
Titanium sublimation pump


Thin-film deposition system III

Thin-film deposition system III: Sputter for SiO2

Sputtering, Shinko Seiki


milling

Ar-ion milling system

Kaufman ion source, Commonwealth Scientific


transfer

Sample transfer system

Custom-built system, Biemtron


Vacuum@annealing furnace

Vacuum annealing furnace with magnet

Toei: >5 kOe, >400Ž


Experimental room II: A041-042

Measurements systms

Electrical measuremet systems

Microwave oscillator N5183B (<40 GHz), Keysight
Lock-in amplifier SR830, SRS
Source measure unit B2901A, Keysight
Multimeter 34460A, Keysight
etc...


Probe system I

RF probe system I

Magnetic field: >150 mT, in-plane
Temperature: room-temperature


Probe system II

RF probe system II

Magnetic field: >1500 mT, any direction
Temperature: room-temperature


Probe system III

RF probe system III

Magnetic field: >700 mT, perpendicular
Temperature: room-temperature


Probe system III

RF probe system IV

Magnetic field: >400 mT, in-plane & perpendicular
Temperature: 15 K ~ 300 K


Laser

Femtosecond pulse laser system

Chameleon Ultra II, Coherent Inc.
CARBIDE (CB5-SP), Light Conversion


Mask aligner

Photolithography system

Mask Aligner M-2L, Mikasa


Optical microscope

Optical microscope

BX53M, Olympus


Spin coater

Spin coater

MS-B100, Mikasa


Atomic force microscope

Surface characterizaton system: AFM

L-trace II, SII



Electron spin resonance measurement system

Electron spin resonance measurement system

ELEXSYS E500 CW-EPR, Bruker


Access

A330, Miwa group, The Institute for Solid State Physics, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan

§277-8581
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@A330@TEL:04-7136-3301
@A329@TEL:04-7136-3300
@A320@TEL:04-7136-3334

Map